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Surface Data

The surface data category highlights databases that allow surface scientists, tribologists, and analytical chemists to analyze surfaces of materials.

Highlights

The NIST X-ray Photoelectron Spectroscopy online system has been a valuable source of binding-energy and related data for the surface analysis of a wide range of materials by x-ray photoelectron spectroscopy.

Version 3.0 of this database provides values of differential elastic-scattering cross sections, total elastic-scattering cross sections, phase shifts, and transport cross sections for elements with atomic numbers from 1 to 96 and for electron energies between 50 eV and 300 keV (in steps of 1 eV). These data can be used in simulations of electron transport in Auger-electron spectroscopy, x-ray photoelectron spectroscopy, electron-probe microanalysis, and analytical electron microscopy.

The NIST Surface Structure Database provides 3-dimensional graphics to allow researchers to visualize the structures of crystal surfaces on the atomic scale.

The NIST Electron Inelastic-Mean-Free-Path Database provides values of electron inelastic mean free paths (IMFPs) for use in quantitative surface analyses by AES and XPS.

Version 1.0 of the NIST Electron Effective-Attenuation-Length Database provides values of electron effective attenuation lengths (EALs) for applications in AES and XPS.

The codes in the list below have the following meanings:

NIST X-ray Photoelectron Spectroscopy, PC, Online, DG*
NIST Electron Elastic-Scattering Cross-Section Database, PC, DG*
NIST Surface Structure, PC, DG*
NIST Electron Inelastic-Mean-Free-Path Database, PC, DG*
NIST Electron Effective-Attenuation-Length Database, PC, DG*