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U.S. Department of Justice

Federal Bureau of Investigation


In Reply, Please Refer to Release No. 219 South Dearborn Street
Chicago, Illinois 60604

 

 

January 17, 2002

Chinese National Arrested for Production of False Identification

Thomas J. Kneir, Special Agent in Charge of the Chicago Office of the Federal Bureau of Investigation (FBI) announced today the arrest of WEN LIN, age 28, of 650 West 31st Street in Chicago. LIN was arrested at his residence earlier today, without incident, by FBI and Immigration and Naturalization Service (INS) Special Agents.

LIN, a Chinese citizen who is believed to have been in the United States illegally, was charged in a criminal complaint filed in U.S. District court in Chicago with the production of false identification, a felony offense punishable by up to ten (10) years imprisonment.

According to the complaint, LIN is alleged to have illegally produced numerous counterfeit documents, including Visas, Passports, Social Security Cards, Illinois Driver's Licenses, Illinois Identification Cards and Immigration Departure Records. All of these counterfeit documents were then allegedly sold on the street for prices ranging from $200 to $1500.

LIN's arrest was the result of the 2½ month investigation conducted jointly by the FBI, INS, the Social Security Administration's Office of the Inspector General and the U.S. Department of State.

LIN appeared before U.S. Magistrate Judge Morton Denlow earlier today and was ordered held without bond, pending his next scheduled court appearance.

The public is reminded that a complaint is not evidence of guilt and that all defendants in a criminal case are presumed innocent until proven guilty in a court of law.

EDITOR'S NOTE: A copy of the complaint filed in this case is available from the Chicago FBI Press Office at (312) 786-2645.




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